Publications2012
- Y.V. Gomeniuk Determination of interface state density in high-k dielectric-silicon system from conductance-frequency measurements Semiconductor Physics, Quantum Electronics & Optoelectronics. – 2012. –vol.15, No.1. -pp.1-7
- Y.V. Gomeniuk Current transport mechanisms in metal - high-k dielectric - silicon structures Semiconductor Physics, Quantum Electronics & Optoelectronics. – 2012. –vol.15, No.2. -pp.139-146
- V. Lozovski, V. Lysenko, M. Spivak, V. Sterligov Interaction between viral particles and structured metal surface under surface plasmon propagation Semiconductor Physics, Quantum Electronics & Optoelectronics. – 2012. –vol.15, No.1. -pp.80-82
- A. Vasin, A. Rusavsky, A. Nazarov, V. Lysenko, G. Rudko, Y. Piryatinski, I. Blonsky, Ja. Salonen, E. Makila, S. Starik Excitation effects and luminescence stability in porous SiO2:C layers Phys. Status Solidi A – 2012, -vol.209, No.6, -pp.1015–1021
- S.O. Gordienko, A.N. Nazarov, A.V. Vasin, A.V. Rusavsky, V.S. Lysenko Correlation of nanostructure and charge transport properties of oxidized a-SiC:H films Phys. Status Solidi C. – 2012. –vol.9, No.6. –pp.1477–1480
- S. Tiagulskyi, A. Nazarov, I. Tyagulskii, V. Lysenko, L. Rebohle, J. Lehmann, W. Skorupa Shell model for REOx nanoclusters in amorphous SiO2: charge trapping and electroluminescence quenching Phys. Status Solidi C. – 2012. –vol.9, No.6. –pp.1468–1470
- Y.V. Gomeniuk, S.O. Gordienko, A.N. Nazarov, A.V. Vasin, A.V. Rusavsky, V.G. Stepanov, V.S. Lysenko, D. Ballutaud, S. Ashok Effect of vacuum annealing on charge transport and trapping in a-Si1-xCx:H/c-Si heterostructures Journal of Non-Crystalline Solids. – 2012. –vol.358. – pp.168–173
- A.V. Vasin, A.V. Rusavsky, A.N. Nazarov, V.S. Lysenko, P.M. Lytvyn, V.V. Strelchuk, K.I. Kholostov, V.P. Bondarenko, S.P. Starik Identification of nanoscale structure and morphology reconstruction in oxidized a-SiC:H thin films Applied Surface Science. – 2012. –vol.260. – pp.73–76
- T. Rudenko, A. Nazarov, I. Ferain, S. Das, R. Yu, S. Barraud, P. Razavi Mobility enhancement effect in heavily doped junctionless nanowire silicon-on-insulator metal-oxide-semiconductor field-effect transistors Applied Physics Letters. – 2012. –vol.101. – pp.213502
- E. O’Connor, K. Cherkaoui, S. Monaghan, D. O’Connell, I. Povey, P. Casey, S.B. Newcomb, Y.Y. Gomeniuk, G. Provenzano, F. Crupi, G. Hughes, P.K. Hurley Observation of peripheral charge induced low frequency capacitance-voltage behaviour in metal-oxide-semiconductor capacitors on Si and GaAs substrates J. Appl. Phys. – 2012. –vol.111. – pp.124104
- S.I. Tiagulskyi, I.P. Tyagulskiy, A.N. Nazarov, T.M. Nazarova, N.L. Rymarenko, V.S. Lysenko, L. Rebohle, J. Lehmann, W. Skorupa Thermal Effect on Electroluminescence Quenching in SiO2 with Ge and ReOx Nanoclusters ECS Transactions. - 2012. –vol.45, No.5. – pp.161-166
- V.S. Lysenko, S.V. Kondratenko, Yu.N. Kozyrev, M.Yu. Rubezhanska, V.P. Kladko, Y.V. Gomeniuk, O.Y. Gudymenko, Ye.Ye. Melnichuk, G. Grenet, N.B. Blanchard Morphology and optical properties of tetragonal Ge nanoclusters grown on chemically oxidized Si(100) surfaces Ukr. J. Phys., 2012, vol.57, No.11, pp.1132-1140
- S.I. Tyagulskiy, I.P. Tyagulskiy, A.N. Nazarov, V.S. Lysenko, T.M. Nazarova, L. Rebohle, J. Lehmann, W. Skorupa Shell Model for Electroluminescence Quenching of Metal-Oxide-Silicon Light-Emitting Devices with SiO2 Enriched with ReOx Nanoclusters Proceeding of the XXXII International Conference ELNANO (Electronics And Nanotechnology) 2012, April 10-12, Kyiv, Ukraine, Kyiv 2012 -pp.55-57