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Publications2007

  1. V. Turchanikov, A. Nazarov, V. Lysenko, E. Tsoi, A. Salonidou, A.G. Nassiopoulou Charging/discharching kinetics in LPCVD silicon nanocrystal MOS memory structure Physica E, vol.38, pp.89-93 (2007)

  2. S.Prucnal, J.M.Sun, A. Nazarov, I.P. Tyagulskii, I.N.Osiyuk, W.Skorupa Correlation between defect-related electroluminescence and charge trapping in Gd-implanted SiO2 layers Applied Physics B: Lasers and Optics. vol.88, No.2. -pp.241-244 (2007)

  3. T. Rudenko, V. Kilchytska, N. Collaert, M. Jurczak, A. Nazarov, V. Lysenko, D. Flandre Electrical properties of FinFET structures Sensor Electronics and Microsystem Technologies No.3 pp.13-18 (2007)

  4. S. Muto, A.V. Vasin, Y. Ishikawa, N. Shibata, J. Salonen and V-P. Lehto Nano-Order Structural Analysis of White Light-Emitting Silicon Oxide Prepared by Successive Thermal Carbonization/Oxidation of the Porous Silicon Materials Science Forum, vol. 561-565 pp.1127-1130 (2007)

  5. T. Rudenko, V. Kilchytska, N. Collaert, M. Jurczak, A. Nazarov, and D. Flandre Reduction of gate-to-channel tunnelling current in FinFET structures vol.51, Solid-State Electronics No.11-12, pp.1467-1473 (2007)

  6. A.V. Vasin, Y. Ishikawa, N. Shibata, J. Salonen, and V.-P. Lehto Strong White Photoluminescence from Carbon-Incorporated Silicon Oxide Fabricated by Preferential Oxidation of Silicon in Nano-Structured Si:C Layer Japanese Journal of Applied Physics, vol.46, No.19, pp.L465-L467 (2007)

  7. T. Rudenko, V. Kilchytska, N. Collaert, M. Jurczak, A. Nazarov and D. Flandre Substrate bias effect linked to parasitic series resistance in multiple-gate SOI MOSFETs IEEE Electron Device Letters, vol.28, No.9, pp.834-836 (2007)

  8. A. Vasin, Y. Ishikawa, N. Shibata, J. Salonen, V-P. Lehto Carbonization of porous silicon for 3C-SiC growth Materials Science Forum, vol.556-557, pp.167-170 (2007)