Publications1998
- V.S. Lysenko, I.P. Tyagulski, V.Z. Lozovski, Y.V. Gomeniuk, I.N. Osiyuk, V.N. Varyukhin Electric field effects at the surface of high-temperature superconductors Journal de Physique IV, vol.8, pp.Pr3-305–Pr.3-308 (1998)
- A.N. Nazarov, V.M. Pinchuk, T.V. Yanchuk, V.S. Lysenko and S. Ashok Enhanced activation of implanted dopant impurity in hydrogenated crystalline silicon Phys. Rev. B, vol.58, No.7, pp.3522-3525 (1998)
- V.S. Lysenko, T.E. Rudenko, A.N. Nazarov, V.I. Kilchitskaya, A.N. Rudenko, A.B. Limanov, J.-P. Colinge High-temperature characteristics of zone-melting recrystallized silicon-on-insulator MOSFETs Semiconductor Physics, Quantum Electronics & Optoelectronics, vol.1, No.1, pp.101-107 (1998)
- A. Boutry-Forveille, D. Ballutaud, and A.N. Nazarov SIMS study of deuterium distribution and thermal stability in ZMR SOI structures Semiconductor Physics, Quantum Electronics & Optoelectronics, vol.1, No.1, pp.108-111 (1998)
- V.S. Lysenko, I.P. Tyagulskii, Y.V. Gomeniuk, I.N. Osiyuk, C.J. Patel, O. Nur, M. Willander The electrical assessment of Si1–xGex/Si heterostructures Journal de Physique IV, vol.8, pp.Pr. 3-87–Pr. 3-90 (1998)
- V.S. Lysenko, I.P. Tyagulski, Y.V. Gomeniuk, I.N. Osiyuk and I.I. Tkach Thermally stimulated characterisation of shallow traps in the SiC/Si heterojunction J. Phys. D: Appl. Phys., vol.31, No.13, pp.1499-1503 (1998)