- T.E. Rudenko, A.N. Rudenko, A.N. Nazarov and V.S. Lysenko Characterization of SOI by capacitance and current measurements with combined gated diode and depletion-mode MOSFET structure Microelectronic Engineering, vol.28, pp.475-478 (1995)
- V.S. Lysenko, Y.V. Gomeniuk, V.Z. Lozovski, I.N. Osiyuk, I.P. Tyagulski, V.N. Varyukhin Dissipation behaviour and critical currents under the strong electrostatic field in the BiPbSrCaCuO thin film Proc. of Symposium on Low Temperature Electronics and High Temperature Superconductivity, Reno, Nevada, 21-26 May, The Electrochem. Soc. Inc., Pennington, pp.148-154 (1995)
- V.S. Lysenko, Y.V. Gomeniuk, I.N. Osiyuk, I.P. Tyagulskii Investigation of traps in the nSiC-pSi interface at cryogenic temperatures Microelectronic Engineering, vol.28, pp.205-208 (1995)
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